摘要
Atomic configuration and connectivity of Sb2Te3 thin film are investigated using high-energy X-ray diffraction and reverse Monte Carlo simulation. Atomic model details of Sb2Te3 thin film are compared with liquid and amorphous Sb2Te3 reported in other article. Simulations show that both Sb-Sb and Te-Te homopolar bonds are present in the models. In phase transition process, atomic configuration of the sample rearranges gradually through the forming of Sb-Te bonds and the breaking of Sb-Sb and Te-Te bonds.
| 源语言 | 英语 |
|---|---|
| 文章编号 | 38 |
| 期刊 | Nuclear Science and Techniques |
| 卷 | 28 |
| 期 | 3 |
| DOI | |
| 出版状态 | 已出版 - 1 3月 2017 |
| 已对外发布 | 是 |
指纹
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