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Landau quantization and the thickness limit of topological insulator thin films of Sb 2Te 3

  • Yeping Jiang
  • , Yilin Wang
  • , Mu Chen
  • , Zhi Li
  • , Canli Song
  • , Ke He
  • , Lili Wang
  • , Xi Chen
  • , Xucun Ma*
  • , Qi Kun Xue
  • *此作品的通讯作者
  • CAS - Institute of Physics
  • Tsinghua University

科研成果: 期刊稿件文章同行评审

摘要

We report the experimental observation of Landau quantization of molecular beam epitaxy grown Sb 2Te 3 thin films by a low-temperature scanning tunneling microscope. Different from all the reported systems, the Landau quantization in a Sb 2Te 3 topological insulator is not sensitive to the intrinsic substitutional defects in the films. As a result, a nearly perfect linear energy dispersion of surface states as a 2D massless Dirac fermion system is achieved. We demonstrate that four quintuple layers are the thickness limit for a Sb 2Te 3 thin film being a 3D topological insulator. The mechanism of the Landau-level broadening is discussed in terms of enhanced quasiparticle lifetime.

源语言英语
文章编号016401
期刊Physical Review Letters
108
1
DOI
出版状态已出版 - 3 1月 2012
已对外发布

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