摘要
Ge44Sn14Te42 phase change material exhibits a higher crystallization temperature (∼221 °C), a larger crystallization activation energy (∼2.88 eV) and a better data retention ability (∼126 °C for 10 years) in comparison with those of Ge 2Sb2Te5. A reversible switching between set and reset can be realized by an electric pulse as short as 10 ns for Ge 44Sn14Te42 based phase change memory (PCM) cell. In addition, PCM based on Ge44Sn14Te42 shows endurance up to 2.7 × 103 cycles with a resistance of about two orders of magnitude on/off ratio.
| 源语言 | 英语 |
|---|---|
| 文章编号 | 142112 |
| 期刊 | Applied Physics Letters |
| 卷 | 103 |
| 期 | 14 |
| DOI | |
| 出版状态 | 已出版 - 30 9月 2013 |
| 已对外发布 | 是 |
指纹
探究 'Investigation of Ge-Sn-Te alloy for long data retention and high speed phase change memory application' 的科研主题。它们共同构成独一无二的指纹。引用此
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