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Investigation of Ge-Sn-Te alloy for long data retention and high speed phase change memory application

  • Zhonghua Zhang
  • , Sannian Song
  • , Zhitang Song
  • , Yan Cheng
  • , Feng Rao
  • , Liangcai Wu
  • , Bo Liu
  • , Bomy Chen
  • , Yegang Lu
  • CAS - Shanghai Institute of Microsystem and Information Technology
  • University of Chinese Academy of Sciences
  • Ningbo University

科研成果: 期刊稿件文章同行评审

摘要

Ge44Sn14Te42 phase change material exhibits a higher crystallization temperature (∼221 °C), a larger crystallization activation energy (∼2.88 eV) and a better data retention ability (∼126 °C for 10 years) in comparison with those of Ge 2Sb2Te5. A reversible switching between set and reset can be realized by an electric pulse as short as 10 ns for Ge 44Sn14Te42 based phase change memory (PCM) cell. In addition, PCM based on Ge44Sn14Te42 shows endurance up to 2.7 × 103 cycles with a resistance of about two orders of magnitude on/off ratio.

源语言英语
文章编号142112
期刊Applied Physics Letters
103
14
DOI
出版状态已出版 - 30 9月 2013
已对外发布

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