摘要
Electronic transport mechanisms in Sb 2 Se 3 thin-film solar cells were investigated using temperature-dependent current-voltage (J-V) measurements. Sb 2 Se 3 thin films were deposited via the vapor transporting deposition method using a double-temperature-zone tubular furnace system, and comparative studies were performed for Sb 2 Se 3 films formed on substrates located at three different positions away from the furnace center. The device efficiency varied from 3.83 to 6.24%. First, structural properties obtained by X-ray diffraction, Raman and scanning electron microscopy measurements verified the optimal Sb 2 Se 3 film quality for the cell with the highest efficiency. Then, temperature-dependent saturation current and open-circuit voltage (V oc ) measurements revealed that the dominant carrier recombination occurred in the CdS/Sb 2 Se 3 interface region, which possibly influenced the V oc for all cells: the highest V oc for the optimal Sb 2 Se 3 cell was at least partly due to it having the lowest CdS/Sb 2 Se 3 interface recombination rate. Finally, the reverse bias current relationship revealed that non-ohmic shunt current (space-charge-limited current, SCLC) plays an important role in affecting the performance of solar cells, as lower-efficiency cells had higher non-ohmic shunt current.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 1-6 |
| 页数 | 6 |
| 期刊 | Solar Energy Materials and Solar Cells |
| 卷 | 197 |
| DOI | |
| 出版状态 | 已出版 - 1 8月 2019 |
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