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Insulating SiO2under Centimeter-Scale, Single-Crystal Graphene Enables Electronic-Device Fabrication

  • Hui Guo
  • , Xueyan Wang
  • , Li Huang
  • , Xin Jin
  • , Zhenzhong Yang
  • , Zhang Zhou
  • , Hai Hu
  • , Yu Yang Zhang
  • , Hongliang Lu
  • , Qinghua Zhang
  • , Chengmin Shen
  • , Xiao Lin
  • , Lin Gu
  • , Qing Dai
  • , Lihong Bao*
  • , Shixuan Du*
  • , Werner Hofer
  • , Sokrates T. Pantelides
  • , Hong Jun Gao*
  • *此作品的通讯作者
  • University of Chinese Academy of Sciences
  • Songshan Lake Materials Laboratory
  • National Center for Nanoscience and Technology
  • Newcastle University
  • Vanderbilt University

科研成果: 期刊稿件文章同行评审

摘要

Graphene on SiO2 enables fabrication of Si-technology-compatible devices, but a transfer of these devices from other substrates and direct growth have severe limitations due to a relatively small grain size or device-contamination. Here, we show an efficient, transfer-free way to integrate centimeter-scale, single-crystal graphene, of a quality suitable for electronic devices, on an insulating SiO2 film. Starting with single-crystal graphene grown epitaxially on Ru(0001), a SiO2 film is grown under the graphene by stepwise intercalation of silicon and oxygen. Thin (∼1 nm) crystalline or thicker (∼2 nm) amorphous SiO2 has been produced. The insulating nature of the thick amorphous SiO2 is verified by transport measurements. The device-quality of the corresponding graphene was confirmed by the observation of Shubnikov-de Haas oscillations, an integer quantum Hall effect, and a weak antilocalization effect within in situ fabricated Hall bar devices. This work provides a reliable platform for applications of large-scale, high-quality graphene in electronics.

源语言英语
页(从-至)8584-8591
页数8
期刊Nano Letters
20
12
DOI
出版状态已出版 - 9 12月 2020
已对外发布

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