摘要
Infrared optical constants of strontium bismuth tantalate (SBT) ferroelectric thin films have been derived from infrared spectroscopic ellipsometric measurements (2.5-12.5 μm). By fitting the experimental pseudodielectric constants 〈∈1〉 and 〈∈2〉 with a three-phase model (Air/SBT/Pt), the optical constants and thickness of the films have been obtained, and an intrinsic vibrational frequency of the films at 802 cm-1 has also been acquired. The possible contribution to the vibrational frequency has been discussed.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 1771-1773 |
| 页数 | 3 |
| 期刊 | Journal of Applied Physics |
| 卷 | 86 |
| 期 | 3 |
| DOI | |
| 出版状态 | 已出版 - 8月 1999 |
| 已对外发布 | 是 |
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