Infrared optical properties of BiFeO3 thin films prepared by chemical solution deposition

Y. W. Li; J. Q. Xue; J. L. Sun; X. J. Meng; Z. M. Huang; J. H. Chu; L. H. Ding; W. F. Zhang

doi:10.1007/s00339-006-3855-y

Infrared optical properties of BiFeO₃ thin films prepared by chemical solution deposition

Y. W. Li
, J. Q. Xue
, J. L. Sun
, X. J. Meng
, Z. M. Huang
, J. H. Chu
, L. H. Ding
, W. F. Zhang^*

^*此作品的通讯作者

Henan University
CAS - Shanghai Institute of Technical Physics

科研成果: 期刊稿件 › 文章 › 同行评审

5 引用（Scopus）

摘要

BiFeO₃ thin films have been grown on Pt(111)/Ti/SiO ₂/Si substrates by chemical solution deposition. It is shown that the films are polycrystalline by the measurement of X-ray diffraction. The infrared optical properties of BiFeO₃ thin films have been investigated using the infrared spectroscopic ellipsometry in the wavelength range of 2.5 to 12.6 μm. The infrared optical constants of the BiFeO₃ thin films are obtained by fitting the measured ellipsometric spectra data using a three-medium model and a classical dielectric function model. The absorption coefficient of BiFeO₃ thin films is greater than 100 cm^-1 in total measured wavelength region and greater than 1000 cm^-1 at the wavelength region above 7.5 μm. It is bigger than that of PbTiO₃, Pb(Zr,Ti)O₃ and (Pb,La)(Zr,Ti)O₃ thin films. It indicates that the BiFeO₃ thin films are excellent candidates for infrared detectors.

源语言	英语
页（从-至）	125-128
页数	4
期刊	Applied Physics A: Materials Science and Processing
卷	87
期	1
DOI	https://doi.org/10.1007/s00339-006-3855-y
出版状态	已出版 - 4月 2007
已对外发布	是

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title = "Infrared optical properties of BiFeO3 thin films prepared by chemical solution deposition",

abstract = "BiFeO3 thin films have been grown on Pt(111)/Ti/SiO 2/Si substrates by chemical solution deposition. It is shown that the films are polycrystalline by the measurement of X-ray diffraction. The infrared optical properties of BiFeO3 thin films have been investigated using the infrared spectroscopic ellipsometry in the wavelength range of 2.5 to 12.6 μm. The infrared optical constants of the BiFeO3 thin films are obtained by fitting the measured ellipsometric spectra data using a three-medium model and a classical dielectric function model. The absorption coefficient of BiFeO3 thin films is greater than 100 cm-1 in total measured wavelength region and greater than 1000 cm-1 at the wavelength region above 7.5 μm. It is bigger than that of PbTiO3, Pb(Zr,Ti)O3 and (Pb,La)(Zr,Ti)O3 thin films. It indicates that the BiFeO3 thin films are excellent candidates for infrared detectors.",

author = "Li, \{Y. W.\} and Xue, \{J. Q.\} and Sun, \{J. L.\} and Meng, \{X. J.\} and Huang, \{Z. M.\} and Chu, \{J. H.\} and Ding, \{L. H.\} and Zhang, \{W. F.\}",

year = "2007",

month = apr,

doi = "10.1007/s00339-006-3855-y",

language = "英语",

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pages = "125--128",

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T1 - Infrared optical properties of BiFeO3 thin films prepared by chemical solution deposition

AU - Li, Y. W.

AU - Xue, J. Q.

AU - Sun, J. L.

AU - Meng, X. J.

AU - Huang, Z. M.

AU - Chu, J. H.

AU - Ding, L. H.

AU - Zhang, W. F.

PY - 2007/4

Y1 - 2007/4

N2 - BiFeO3 thin films have been grown on Pt(111)/Ti/SiO 2/Si substrates by chemical solution deposition. It is shown that the films are polycrystalline by the measurement of X-ray diffraction. The infrared optical properties of BiFeO3 thin films have been investigated using the infrared spectroscopic ellipsometry in the wavelength range of 2.5 to 12.6 μm. The infrared optical constants of the BiFeO3 thin films are obtained by fitting the measured ellipsometric spectra data using a three-medium model and a classical dielectric function model. The absorption coefficient of BiFeO3 thin films is greater than 100 cm-1 in total measured wavelength region and greater than 1000 cm-1 at the wavelength region above 7.5 μm. It is bigger than that of PbTiO3, Pb(Zr,Ti)O3 and (Pb,La)(Zr,Ti)O3 thin films. It indicates that the BiFeO3 thin films are excellent candidates for infrared detectors.

AB - BiFeO3 thin films have been grown on Pt(111)/Ti/SiO 2/Si substrates by chemical solution deposition. It is shown that the films are polycrystalline by the measurement of X-ray diffraction. The infrared optical properties of BiFeO3 thin films have been investigated using the infrared spectroscopic ellipsometry in the wavelength range of 2.5 to 12.6 μm. The infrared optical constants of the BiFeO3 thin films are obtained by fitting the measured ellipsometric spectra data using a three-medium model and a classical dielectric function model. The absorption coefficient of BiFeO3 thin films is greater than 100 cm-1 in total measured wavelength region and greater than 1000 cm-1 at the wavelength region above 7.5 μm. It is bigger than that of PbTiO3, Pb(Zr,Ti)O3 and (Pb,La)(Zr,Ti)O3 thin films. It indicates that the BiFeO3 thin films are excellent candidates for infrared detectors.

UR - https://www.scopus.com/pages/publications/33847194698

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DO - 10.1007/s00339-006-3855-y

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VL - 87

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JO - Applied Physics A: Materials Science and Processing

JF - Applied Physics A: Materials Science and Processing

IS - 1

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Infrared optical properties of BiFeO3 thin films prepared by chemical solution deposition

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Infrared optical properties of BiFeO₃ thin films prepared by chemical solution deposition