摘要
SrBi2-χNdχNb2O9 (χ=0, 0.1, 0.2 and 0.4) bismuth layer-structured ferroelectric ceramics were prepared by the solid-state reaction sintering method. The accurate position of Nd element in SrBi2-χNdχNb2O9 ceramics was determined by the X-ray Rietveld method and Synchrotron radiation X-ray absorption fine structure (XAFS) technology. The partial substitution of Nd3+ for Bi3+ leads to the decrease in the distortion of NbO6 octahedron for SrBi2-χNdχNb2O9 ceramics and also lowers the piezoelectric properties of SrBi2-χNdχNb2O9 ceramics. Meanwhile, the temperature coefficient of resonant frequency (TCF) decreases when Nd element partially replaces Bi element in SrBi2-χNdχNb2O9 ceramics.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 1459-1463 |
| 页数 | 5 |
| 期刊 | Transactions of Nonferrous Metals Society of China (English Edition) |
| 卷 | 19 |
| 期 | 6 |
| DOI | |
| 出版状态 | 已出版 - 12月 2009 |
学术指纹
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