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Highly (h00) oriented growth of SrTiO3 thin films on Si(100) substrates by RF magnetron sputtering and their optical properties

  • J. H. Ma
  • , J. H. Pin
  • , Z. M. Huang
  • , Y. H. Gao
  • , T. Lin
  • , F. W. Shi
  • , J. L. Sun
  • , J. H. Chu

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

SrTiO3 (STO) thin films were grown on Si(100) substrates by RF magnetron sputtering. The substrate temperature was found to be a crucial parameter to obtain the highly (h00) oriented growth. At the substrate temperature of 700 °C, STO thin films with the (h00)-orientation parameter (αh00) of more than 93% were realized. Using vitreous silica as the substrate, the optical properties of STO thin film prepared at 700 °C were investigated by transmittance measurements. The fitting method was used to calculate the refractive index and the film thickness from the transparent region of the transmittance spectra. The dispersion of the refractive index was studied by considering a single electronic oscillator model. According to Tauc's law, the band gap of the film was found to be about 3.62 eV.

源语言英语
主期刊名Sixth International Conference on Thin Film Physics and Applications
DOI
出版状态已出版 - 2008
已对外发布
活动6th International Conference on Thin Film Physics and Applications, TFPA 2007 - Shanghai, 中国
期限: 25 9月 200728 9月 2007

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
6984
ISSN(印刷版)0277-786X

会议

会议6th International Conference on Thin Film Physics and Applications, TFPA 2007
国家/地区中国
Shanghai
时期25/09/0728/09/07

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