跳到主要导航 跳到搜索 跳到主要内容

Hidden structural phase transition assisted ferroelectric domain orientation engineering in Hf0.5Zr0.5O2 films

  • Yuyan Fan
  • , Shunda Zhang
  • , Zhipeng Xue
  • , Yulong Dong
  • , Danyang Chen
  • , Jiahui Zhang
  • , Jingquan Liu
  • , Mengwei Si
  • , Chunlai Luo
  • , Wenwu Li*
  • , Junhao Chu
  • , Yanwei Cao*
  • , Zhen Wang*
  • , Xiuyan Li*
  • *此作品的通讯作者
  • Shanghai Jiao Tong University
  • CAS - Ningbo Institute of Material Technology and Engineering
  • Fudan University
  • University of Science and Technology of China

科研成果: 期刊稿件文章同行评审

摘要

The polarization of HfO2-based ferroelectrics originates from the metastable orthorhombic phase formed during the tetragonal to monoclinic phase transition and is typically controlled by tuning the phase content. However, another way to control polarization via modulating ferroelectric domain orientations remains underexplored. This work uncovers a hidden tetragonal-orthorhombic phase transition pathway to engineer domain orientations and further polarization in polycrystalline Hf0.5Zr0.5O2 using single-crystalline TiN substrates. Specifically, (001)O and/or (010)O domains, which fully contribute to remanent polarization under an electric field, are controllable in Hf0.5Zr0.5O2 on TiN (001) and (111), enhancing remanent polarization compared to that on TiN (110). The key is the hidden transition from the tetragonal phase’s longest c-axis to the orthorhombic phase’s shorter bO/cO-axis, alongside the reported one to the longest aO-axis, assisted by periodic dislocations at the TiN/Hf0.5Zr0.5O2 interface. These findings shed light on governing the polarization of Hf0.5Zr0.5O2 films by controlling the interface dislocations and further domain orientations.

源语言英语
文章编号4232
期刊Nature Communications
16
1
DOI
出版状态已出版 - 12月 2025
已对外发布

指纹

探究 'Hidden structural phase transition assisted ferroelectric domain orientation engineering in Hf0.5Zr0.5O2 films' 的科研主题。它们共同构成独一无二的指纹。

引用此