Guest Editorial

^*此作品的通讯作者

科研成果: 期刊稿件 › 社论

源语言	英语
页（从-至）	579-580
页数	2
期刊	Journal of Electronic Testing: Theory and Applications (JETTA)
卷	35
期	5
DOI	https://doi.org/10.1007/s10836-019-05836-6
出版状态	已出版 - 1 10月 2019

访问文件

@article{a028ec6555294e6297268a096b9686f5,

title = "Guest Editorial",

author = "Kanad Basu and Mingsong Chen and Rubin Parekhji",

year = "2019",

month = oct,

day = "1",

doi = "10.1007/s10836-019-05836-6",

language = "英语",

volume = "35",

pages = "579--580",

journal = "Journal of Electronic Testing: Theory and Applications (JETTA)",

issn = "0923-8174",

publisher = "Springer Netherlands",

number = "5",

}

TY - JOUR

T1 - Guest Editorial

AU - Basu, Kanad

AU - Chen, Mingsong

AU - Parekhji, Rubin

PY - 2019/10/1

Y1 - 2019/10/1

UR - https://www.scopus.com/pages/publications/85075185086

U2 - 10.1007/s10836-019-05836-6

DO - 10.1007/s10836-019-05836-6

M3 - 社论

AN - SCOPUS:85075185086

SN - 0923-8174

VL - 35

SP - 579

EP - 580

JO - Journal of Electronic Testing: Theory and Applications (JETTA)

JF - Journal of Electronic Testing: Theory and Applications (JETTA)

IS - 5

ER -