摘要
We report on the precipitation of Si nanocrystals inside a borosilicate glass by using an 800 nm, 250 kHz femtosecond laser irradiation, which was confirmed with X-ray diffraction, Raman spectra and transmission electron microscopy analyses. Refractive index profile reveals that the refractive index of the Si nanocrystals precipitated region increased up to 8.7% in comparison with that of the unirradiated area, leading to a large diffraction efficiency of the fabricated dot structure. Furthermore, the third-order optical nonlinearity of the Si nanocrystals precipitated glass is greatly enhanced based on the Z-scan measurement. These results may find applications for the fabrication diffractive optical devices and optical switches. Crown
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 3544-3547 |
| 页数 | 4 |
| 期刊 | Materials Letters |
| 卷 | 65 |
| 期 | 23-24 |
| DOI | |
| 出版状态 | 已出版 - 12月 2011 |
| 已对外发布 | 是 |
指纹
探究 'Formation of Si nanocrystals in glass by femtosecond laser micromachining' 的科研主题。它们共同构成独一无二的指纹。引用此
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