Feedback-Guided Circuit Structure Mutation for Testing Hardware Model Checkers

Chengyu Zhang; Minquan Sun; Jianwen Li; Ting Su; Geguang Pu

doi:10.1109/ICCAD51958.2021.9643509

Feedback-Guided Circuit Structure Mutation for Testing Hardware Model Checkers

Chengyu Zhang
, Minquan Sun
, Jianwen Li
, Ting Su
, Geguang Pu^*

^*此作品的通讯作者

软件工程学院

East China Normal University

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

2 引用（Scopus）

摘要

We introduce Circuit Structure Mutation, a simple but effective mutation-based testing approach, for testing hardware model checkers. The key idea is to mutate the existing And-Inverter Graph (AIG) circuit by manipulating the relations among the components in the graph while preserving the validity of the mutant. Based on Circuit Structure Mutation, we implemented a feedback-guided testing tool named Hammer. In our evaluation, Hammer shows its effectiveness on finding bugs, increasing test coverage, and finding performance optimization chances, which can help the hardware model checker developers improve the reliability and the performance of their tools.

源语言	英语
主期刊名	2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings
出版商	Institute of Electrical and Electronics Engineers Inc.
ISBN（电子版）	9781665445078
DOI	https://doi.org/10.1109/ICCAD51958.2021.9643509
出版状态	已出版 - 2021
活动	40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Munich, 德国期限: 1 11月 2021 → 4 11月 2021

出版系列

姓名	IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
卷	2021-November
ISSN（印刷版）	1092-3152

会议

会议	40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021
国家/地区	德国
市	Munich
时期	1/11/21 → 4/11/21

访问文件

10.1109/ICCAD51958.2021.9643509

其它文件与链接

链接到 Scopus 的出版物

引用此

Zhang, C., Sun, M., Li, J., Su, T., & Pu, G. (2021). Feedback-Guided Circuit Structure Mutation for Testing Hardware Model Checkers. 在 2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD; 卷 2021-November). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICCAD51958.2021.9643509

Zhang, Chengyu ; Sun, Minquan ; Li, Jianwen 等. / Feedback-Guided Circuit Structure Mutation for Testing Hardware Model Checkers. 2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2021. (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD).

@inproceedings{c60f21d238f94b4ab7bbb53670e1c9a9,

title = "Feedback-Guided Circuit Structure Mutation for Testing Hardware Model Checkers",

abstract = "We introduce Circuit Structure Mutation, a simple but effective mutation-based testing approach, for testing hardware model checkers. The key idea is to mutate the existing And-Inverter Graph (AIG) circuit by manipulating the relations among the components in the graph while preserving the validity of the mutant. Based on Circuit Structure Mutation, we implemented a feedback-guided testing tool named Hammer. In our evaluation, Hammer shows its effectiveness on finding bugs, increasing test coverage, and finding performance optimization chances, which can help the hardware model checker developers improve the reliability and the performance of their tools.",

keywords = "Hardware Model Checking, Software Testing, Test Case Generation",

author = "Chengyu Zhang and Minquan Sun and Jianwen Li and Ting Su and Geguang Pu",

note = "Publisher Copyright: {\textcopyright} 2021 Institute of Electrical and Electronics Engineers Inc.. All rights reserved.; 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 ; Conference date: 01-11-2021 Through 04-11-2021",

year = "2021",

doi = "10.1109/ICCAD51958.2021.9643509",

language = "英语",

series = "IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings",

address = "美国",

}

Zhang, C, Sun, M, Li, J , Su, T & Pu, G 2021, Feedback-Guided Circuit Structure Mutation for Testing Hardware Model Checkers. 在 2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings. IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD, 卷 2021-November, Institute of Electrical and Electronics Engineers Inc., 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021, Munich, 德国, 1/11/21. https://doi.org/10.1109/ICCAD51958.2021.9643509

Feedback-Guided Circuit Structure Mutation for Testing Hardware Model Checkers. / Zhang, Chengyu; Sun, Minquan; Li, Jianwen 等.
2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2021. (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD; 卷 2021-November).

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

TY - GEN

T1 - Feedback-Guided Circuit Structure Mutation for Testing Hardware Model Checkers

AU - Zhang, Chengyu

AU - Sun, Minquan

AU - Li, Jianwen

AU - Su, Ting

AU - Pu, Geguang

PY - 2021

Y1 - 2021

N2 - We introduce Circuit Structure Mutation, a simple but effective mutation-based testing approach, for testing hardware model checkers. The key idea is to mutate the existing And-Inverter Graph (AIG) circuit by manipulating the relations among the components in the graph while preserving the validity of the mutant. Based on Circuit Structure Mutation, we implemented a feedback-guided testing tool named Hammer. In our evaluation, Hammer shows its effectiveness on finding bugs, increasing test coverage, and finding performance optimization chances, which can help the hardware model checker developers improve the reliability and the performance of their tools.

AB - We introduce Circuit Structure Mutation, a simple but effective mutation-based testing approach, for testing hardware model checkers. The key idea is to mutate the existing And-Inverter Graph (AIG) circuit by manipulating the relations among the components in the graph while preserving the validity of the mutant. Based on Circuit Structure Mutation, we implemented a feedback-guided testing tool named Hammer. In our evaluation, Hammer shows its effectiveness on finding bugs, increasing test coverage, and finding performance optimization chances, which can help the hardware model checker developers improve the reliability and the performance of their tools.

KW - Hardware Model Checking

KW - Software Testing

KW - Test Case Generation

UR - https://www.scopus.com/pages/publications/85124135287

U2 - 10.1109/ICCAD51958.2021.9643509

DO - 10.1109/ICCAD51958.2021.9643509

M3 - 会议稿件

AN - SCOPUS:85124135287

T3 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

BT - 2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021

Y2 - 1 November 2021 through 4 November 2021

ER -

Zhang C, Sun M, Li J , Su T , Pu G. Feedback-Guided Circuit Structure Mutation for Testing Hardware Model Checkers. 在 2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2021. (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD). doi: 10.1109/ICCAD51958.2021.9643509

Feedback-Guided Circuit Structure Mutation for Testing Hardware Model Checkers

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