TY - JOUR
T1 - Extension of imaging depth in two-photon fluorescence microscopy using a long-wavelength high-pulse-energy femtosecond laser source
AU - Wang, C.
AU - Qiao, L.
AU - He, F.
AU - Cheng, Y.
AU - Xu, Z.
PY - 2011/8
Y1 - 2011/8
N2 - We experimentally demonstrate, for the first time to the best of our knowledge, two-photon fluorescence imaging with a femtosecond optical parametric amplifier. In particular, we systematically compare the imaging depths of two-photon fluorescence microscopes based on three different excitation sources, including a femtosecond oscillator, a femtosecond regenerative amplifier and the optical parametric amplifier. The results show that the optical parametric amplifier can greatly extend the penetration depth by approximately 227% as compared with that obtained with the femtosecond oscillator due to effective suppression of scattering at longer wavelength and enhanced excitation efficiency enabled by higher pulse energy.
AB - We experimentally demonstrate, for the first time to the best of our knowledge, two-photon fluorescence imaging with a femtosecond optical parametric amplifier. In particular, we systematically compare the imaging depths of two-photon fluorescence microscopes based on three different excitation sources, including a femtosecond oscillator, a femtosecond regenerative amplifier and the optical parametric amplifier. The results show that the optical parametric amplifier can greatly extend the penetration depth by approximately 227% as compared with that obtained with the femtosecond oscillator due to effective suppression of scattering at longer wavelength and enhanced excitation efficiency enabled by higher pulse energy.
KW - Femtosecond optical parametric amplifier (OPA)
KW - Femtosecond oscillator
KW - Femtosecond regenerative amplifier
KW - Imaging depth
KW - Two-photon fluorescence microscopy
UR - https://www.scopus.com/pages/publications/79960416731
U2 - 10.1111/j.1365-2818.2011.03492.x
DO - 10.1111/j.1365-2818.2011.03492.x
M3 - 文章
C2 - 21388374
AN - SCOPUS:79960416731
SN - 0022-2720
VL - 243
SP - 179
EP - 183
JO - Journal of Microscopy
JF - Journal of Microscopy
IS - 2
ER -