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Experimental verification on the origin of plateau-like current-voltage characteristics of resonant tunneling diodes

  • Z. J. Qiu*
  • , Y. S. Gui
  • , S. L. Guo
  • , N. Dai
  • , J. H. Chu
  • , X. X. Zhang
  • , Y. P. Zeng
  • *此作品的通讯作者
  • CAS - Shanghai Institute of Technical Physics
  • CAS - Institute of Semiconductors

科研成果: 期刊稿件文章同行评审

摘要

The current-voltage characteristics of GaAs-based resonant tunneling diodes were investigated in the presence of a perpendicular magnetic field. It was observed that the electron resonant tunneling was strongly suppressed by the applied magnetic field. The current instability were also observed in the negative differential resistance (NDR) and was attributed to current oscillations between device and external circuit. It was found that the plateau-like structures were due to the coupling between the energy levels in the emitter well and in the main quantum well.

源语言英语
页(从-至)1961-1963
页数3
期刊Applied Physics Letters
84
11
DOI
出版状态已出版 - 15 3月 2004
已对外发布

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