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Evolution of electric field amplitude dependent scaling behaviors in ferroelectric films over a broad temperature range

  • J. Yang*
  • , X. J. Meng
  • , M. R. Shen
  • , C. Gao
  • , J. L. Sun
  • , J. H. Chu
  • *此作品的通讯作者

科研成果: 期刊稿件文章同行评审

摘要

The evolution of the electric field amplitude (V0) dependent scaling of dynamic hysteresis area (A V0α) with the temperature in Mn doped (Pb,Sr) TiO3 film was analyzed. α exhibited different values under three temperature regions, where (1) the intrinsic ferroelectric domain nucleation, growth, and reversal, (2) the competition between the polar nanoregions and mobile defects, and (3) the Joule loss during long range movement of oxygen vacancies were demonstrated. This study provides a quantitative criterion to distinguish the intrinsic ferroelectric hysteresis from artificial one.

源语言英语
文章编号092908
期刊Applied Physics Letters
93
9
DOI
出版状态已出版 - 2008

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