摘要
The alloying of wide-band-gap ZnO and GaN causes band-gap reduction, enabling visible-light-driven photocatalysis for high-efficiency water splitting. However, challenges in single-crystal (GaN)1-x(ZnO)x solid-solution synthesis prevent a better understanding of the optical properties and electronic structures. Here, low-temperature epitaxial growth of (GaN)1-x(ZnO)x thin films with a wide tunability of chemical composition is demonstrated by using a multitarget pulsed-laser-deposition (PLD) system. The phase pure (GaN)1-x(ZnO)x solid solution is obtained by alternately depositing GaN and ZnO with the thickness of each GaN/ZnO pair set within one or two unit cells. The band gap of the solid-solution thin films as a function of systematically controlled chemical composition shows asymmetric bowing with a minimum at approximately 2.0 eV for x = 0.65. Furthermore, a large absorption coefficient (>104cm-1) in the visible-light region is observed. The shape of the absorption edge is not consistent with that of a direct-transition semiconductor. First-principles calculation suggests that this inconsistency originates from localization of the valence-band maximum on N atoms bonded with Zn. A technique for fabricating high-quality epitaxial (GaN)1-x(ZnO)x solid solutions is essential for acquiring a deep understanding of the fundamental properties of this system.
| 源语言 | 英语 |
|---|---|
| 文章编号 | 044001 |
| 期刊 | Physical Review Applied |
| 卷 | 10 |
| 期 | 4 |
| DOI | |
| 出版状态 | 已出版 - 1 10月 2018 |
| 已对外发布 | 是 |
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