摘要
Cathodic LiMn2O4 films on various single-crystal substrates for use in thin-film Li-ion batteries prepared using a chemical solution deposition method are reported. Transmission electron microscopy is utilized to characterize the microstructures of the films. The results show that the film/substrate lattice misfit can affect significantly the quality of epitaxially grown grains of LiMn2O4. Using state-of-the-art high-angle annular dark-field imaging, the degree of coherency and lattice distortion at interfaces between LiMn2O4 and Au-coated and uncoated Al2O3 (0001) single-crystal substrates are examined at the atomic scale. When the lattice misfit is sufficiently small, fully coherent LiMn2O4/Au heterointerfaces form, although lattice strain to a distance of up to around 10 nm from the interface changes the symmetry of spinel LiMn2O 4 from cubic to tetragonal. Such an interface in the LiMn 2O4/Au/Al2O3 system facilitates high-quality epitaxial film growth to thicknesses of a couple hundred nanometers.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 19540-19547 |
| 页数 | 8 |
| 期刊 | Journal of Physical Chemistry C |
| 卷 | 118 |
| 期 | 34 |
| DOI | |
| 出版状态 | 已出版 - 28 8月 2014 |
| 已对外发布 | 是 |
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