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Enhancing the Thermal Conductivity of Graphene-based Thermal Interface Materials by Polyimide Fiber Intercalation

  • East China Normal University
  • CAS - Shanghai Institute of Technical Physics

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

摘要

Temperature is an important factor affecting the reliability of electronic components. High temperature environments have a direct negative impact on the performance and lifetime of electronic devices. Graphene, a remarkable two-dimensional carbon material renowned for its exceptional in-plane thermal conductivity properties, faces a significant challenge due to the high phonon transport barrier at the van der Waals interface between its layers. This poses a limitation for meeting the heat dissipation requirements of cutting-edge electronic devices. In this study, a graphene composite film with polyimide (PI) fiber intercalation is presented. Graphene oxide (GO) and PI composite films were obtained by solution blending of PI fibers and GO. Subsequently, the GO/PI film was graphitised and calendered at high temperature to obtain the dense g-GO/PI film. The PI fiber intercalation constructs a three-dimensional thermal conductivity network that enables the g-GO/PI film to have high in-plane thermal conductivity (1406 W m-1K-1) and through-plane thermal conductivity (21.3 W m-1 K-1). The exceptional thermal conductivity of the graphitized GO/PI film (g-GO/PI) as a thermal interface material confirms its superior thermal management capability compared to copper foil. This presents an enticing prospect for the integration of advanced thermal management systems in future high-performance flexible electronic devices.

源语言英语
主期刊名2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2024
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9798350360608
DOI
出版状态已出版 - 2024
活动2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2024 - Singapore, 新加坡
期限: 15 7月 2024 → 18 7月 2024

丛书

姓名Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
ISSN(印刷版)1946-1542
ISSN(电子版)1946-1550

会议

会议2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2024
国家/地区新加坡
市Singapore
时期15/07/24 → 18/07/24

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