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Enhanced Fröhlich interaction of semiconductor cuprous oxide films determined by temperature-dependent Raman scattering and spectral transmittance

  • Wenlei Yu
  • , Meijie Han
  • , Kai Jiang
  • , Zhihua Duan
  • , Yawei Li
  • , Zhigao Hu*
  • , Junhao Chu
  • *此作品的通讯作者
  • East China Normal University

科研成果: 期刊稿件文章同行评审

摘要

Anomalous low temperature behaviors in cuprous oxide (Cu2O) film grown on quartz substrate have been investigated by temperature-dependent Raman and transmittance spectra. The longitudinal optical components of two Γ15- phonon modes become sharper and more intense at a low temperature. It can be found that the highest-order electronic transition located at 6.4 eV exhibits a minimum transmittance near 200 K. Correspondingly, the variations from phonon intensity ratios reveal obvious anomalies with the decreasing temperature, indicating the existence of strong electron-phonon coupling mediated by Fröhlich interaction in the Cu2O films below the temperature of 200 K.

源语言英语
页(从-至)142-146
页数5
期刊Journal of Raman Spectroscopy
44
1
DOI
出版状态已出版 - 1月 2013

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