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Enhance Language Model-based Repair for Memory-related Vulnerabilities via Knowledge-and Semantic-guided Analysis

  • Hao Shen
  • , Ming Hu*
  • , Yanxin Yang
  • , Xiaofei Xie
  • , Mingsong Chen*
  • *此作品的通讯作者
  • East China Normal University
  • Singapore Management University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Memory-related vulnerabilities often result in system crashes and performance drops, imposing significant risks for embedded systems. Despite the potential of Language Models (LMs) in program repair, existing LM-based approaches struggle with these vulnerabilities due to two primary limitations: i) LMs do not possess adequate domain knowledge concerning program analysis and the characteristics of memory-related vulnerabilities, and ii) LMs face constraints in managing contexts as the size of programs increases. To address this issue, we introduce MVRepair, a novel lightweight Language Model (ℓLM)-driven framework built upon a domain-specific knowledge library that is developed through the examination of 7,935 real-world memory-related vulnerabilities. By using our proposed knowledge-based analysis strategy and semantic-guided segmentation mechanism, MVRepair can substantially enhance the LM's ability to repair programs with memory-related vulnerabilities. Comprehensive experimental results on 8,118 real-world memory-related vulnerabilities demonstrate that, compared with state-of-the-art LM-based approaches, MVRepair yields improvements of a minimum of 23.8% in EM, 31.9% in BLEU-4, and 16.7% in CodeBLEU.

源语言英语
主期刊名2026 Design, Automation and Test in Europe Conference, DATE 2026 - Proceedings
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9783982674117
DOI
出版状态已出版 - 2026
活动2026 Design, Automation and Test in Europe Conference, DATE 2026 - Verona, 意大利
期限: 20 4月 202622 4月 2026

丛书

姓名Proceedings -Design, Automation and Test in Europe, DATE
ISSN(印刷版)1530-1591

会议

会议2026 Design, Automation and Test in Europe Conference, DATE 2026
国家/地区意大利
Verona
时期20/04/2622/04/26

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