摘要
This paper proposes an improved PHEMT DC model which covers high and low current applications, as well good agreement is obtained between simulated and measured results for a 0.25(1 × 40) μm double heterostructure PHEMT.
| 源语言 | 英语 |
|---|---|
| 页 | 99-101 |
| 页数 | 3 |
| 出版状态 | 已出版 - 2003 |
| 已对外发布 | 是 |
| 活动 | 2003 SMBO/IEEE MTT-S International Microwave and Optoelectronics Conference - IMOC 2003 - Foz do Iguacu, 巴西 期限: 20 9月 2003 → 23 9月 2003 |
会议
| 会议 | 2003 SMBO/IEEE MTT-S International Microwave and Optoelectronics Conference - IMOC 2003 |
|---|---|
| 国家/地区 | 巴西 |
| 市 | Foz do Iguacu |
| 时期 | 20/09/03 → 23/09/03 |
指纹
探究 'Empirical All Region Current Based PHEMT DC Model' 的科研主题。它们共同构成独一无二的指纹。引用此
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