@inproceedings{4df6fb5a28484de2a9626f589bc9842b,
title = "Electrothermal Model Parameters Extraction and Evaluation Based on BSIM-CMG for 7-nm Nanosheet Gate-All-Around Transistor",
abstract = "In this paper, the BSIM-CMG model parameters are extracted for the nanosheet gate-AlI-Around (GAA) transistors with considering the temperature distribution and self-heating (SH) effect. The data used for parameter extraction is obtained from the 3-D TCAD simulation, which is calibrated with the experimental data to ensure the analysis accuracy. The extracted model and its parameter are validated from-40°C to 125°C. In order to evaluate our extracted model, the performance of the 6T-SRAM is investigated considering SH effect within different ambient temperature (TA). The results show that the read and write noise margins are all degenerated with increasing TA, and the static power increases as expected.",
author = "Liu, \{Ren Hua\} and Yang, \{Si Qi\} and Li, \{Xiao Jin\} and Sun, \{Ya Bin\} and Shi, \{Yan Ling\}",
note = "Publisher Copyright: {\textcopyright} 2020 IEEE.; 15th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2020 ; Conference date: 03-11-2020 Through 06-11-2020",
year = "2020",
month = nov,
day = "3",
doi = "10.1109/ICSICT49897.2020.9278358",
language = "英语",
series = "2020 IEEE 15th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2020 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
editor = "Shaofeng Yu and Xiaona Zhu and Ting-Ao Tang",
booktitle = "2020 IEEE 15th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2020 - Proceedings",
address = "美国",
}