Electrical and optical properties of a kind of ferroelectric oxide films comprising of PbZr_0.4Ti_0.6O₃ stacks

A type of ferroelectric oxide films, consisting of three PbZr_0.4Ti_0.6O₃ stacks with different periodic thicknesses, has been designed and fabricated on F-doped transparent conductive tin oxide substrates by using one single precursor solution and spinning-coating process. These films exhibit superior ferroelectric, dielectric, and optical performance. Each PbZr_0.4Ti_0.6O₃ multilayer has a high reflectivity band with ∼110 nm photonic band width and average reflectivity of >80%, a dielectric constant of 530 and dielectric tunability of ∼28% at 1 MHz, a remnant polarization of 36 μC/cm², and a polarization loss of <5% after 10⁹ polarization switching cycles, rendering their perspective application in photonic band-gap engineering, microwave tunable devices, and integrated optoelectronics.