TY - JOUR
T1 - Efficient test case generation for validation of UML activity diagrams
AU - Chen, Mingsong
AU - Mishra, Prabhat
AU - Kalita, Dhrubajyoti
PY - 2010/6
Y1 - 2010/6
N2 - Unified Modeling Language (UML) is widely used as a system level specification language in embedded system design. Due to the increasing complexity of embedded systems, the analysis and validation of UML specifications is becoming a challenge. UML activity diagram is promising to modeling the overall system behavior. However, lack of techniques for automated test case generation is one major bottleneck in the UML activity diagram validation. This article presents a methodology for automatically generating test cases based on various model checking techniques. It makes three primary contributions: First, we propose coverage-driven mapping rules that can automatically translate activity diagram to formal models. Next, we present a procedure for automatic property generation according to error models. Finally, we apply various model checking based test case generation techniques to enable efficient test case generation. Our experimental results demonstrate that our approach can reduce the validation effort drastically by reducing both test case generation time and required number of test cases to achieve a functional coverage goal.
AB - Unified Modeling Language (UML) is widely used as a system level specification language in embedded system design. Due to the increasing complexity of embedded systems, the analysis and validation of UML specifications is becoming a challenge. UML activity diagram is promising to modeling the overall system behavior. However, lack of techniques for automated test case generation is one major bottleneck in the UML activity diagram validation. This article presents a methodology for automatically generating test cases based on various model checking techniques. It makes three primary contributions: First, we propose coverage-driven mapping rules that can automatically translate activity diagram to formal models. Next, we present a procedure for automatic property generation according to error models. Finally, we apply various model checking based test case generation techniques to enable efficient test case generation. Our experimental results demonstrate that our approach can reduce the validation effort drastically by reducing both test case generation time and required number of test cases to achieve a functional coverage goal.
KW - Model checking
KW - Property decomposition
KW - Testing
KW - UML activity diagram
UR - https://www.scopus.com/pages/publications/77956925133
U2 - 10.1007/s10617-010-9052-4
DO - 10.1007/s10617-010-9052-4
M3 - 文章
AN - SCOPUS:77956925133
SN - 0929-5585
VL - 14
SP - 105
EP - 130
JO - Design Automation for Embedded Systems
JF - Design Automation for Embedded Systems
IS - 2
ER -