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Efficient self-learning techniques for SAT-based test generation

  • East China Normal University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

SAT-based approaches are promising for automated generation of directed tests. However, due to the state space explosion problem, these methods do not scale well for complex designs. Although various heuristics are proposed to address test generation complexity, most of them require expert knowledge regarding the detailed structure and behavior information of designs explicitly, which limits their usage. This paper proposes promising techniques to derive profitable learnings from the SAT instance itself. The obtained self-learnings can efficiently reduce the chance of long distance backtracks and improve satisfying assignment convergence rate during the SAT search. Experimental results demonstrate that our method can reduce the test generation time by several orders of magnitude.

源语言英语
主期刊名CODES+ISSS'12 - Proceedings of the 10th ACM International Conference on Hardware/Software-Codesign and System Synthesis, Co-located with ESWEEK
197-205
页数9
DOI
出版状态已出版 - 2012
活动10th ACM International Conference on Hardware/Software-Codesign and System Synthesis, CODES+ISSS 2012, Co-located with 8th Embedded Systems Week, ESWEEK 2012 - Tampere, 芬兰
期限: 7 10月 201212 10月 2012

出版系列

姓名CODES+ISSS'12 - Proceedings of the 10th ACM International Conference on Hardware/Software-Codesign and System Synthesis, Co-located with ESWEEK

会议

会议10th ACM International Conference on Hardware/Software-Codesign and System Synthesis, CODES+ISSS 2012, Co-located with 8th Embedded Systems Week, ESWEEK 2012
国家/地区芬兰
Tampere
时期7/10/1212/10/12

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