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Effects of thickness on thermoelectric properties of Bi0.5Sb1.5Te3 thin films

  • Xiaobin Han
  • , Zhenyu Zhang*
  • , Zhengmao Liu
  • , Chao Xu
  • , Xiaowei Lu
  • , Lin Sun
  • , Peng Jiang*
  • *此作品的通讯作者
  • Dalian University of Technology
  • CAS - Dalian Institute of Chemical Physics

科研成果: 期刊稿件文章同行评审

摘要

Bi2Te3-based materials have been widely utilized for commercial bulk thermoelectric (TE) devices. For the manufacture of miniaturized TE devices, the large-scale deposition of high-performance Bi2Te3-based thin films is crucial. However, it has not yet been effectively resolved. Herein, the Bi0.5Sb1.5Te3 films with different thicknesses were grown on sapphire substrates by controlling the co-sputtering time. We reveal that the film thickness has a significant impact on the electrical transport properties. Due to the mutual influence of electrical conductivity and Seebeck coefficient, there exists an optimal thickness with the maximum power factor is as high as 2900 μW m−1 K−2. Therefore, systematic research on the thickness-dependent TE characteristics of Bi2Te3-based films and the deposition of high-performance films will provide important information for the large-scale development of high-performance micro-TE devices.

源语言英语
页(从-至)2375-2381
页数7
期刊Applied Nanoscience (Switzerland)
10
7
DOI
出版状态已出版 - 1 7月 2020
已对外发布

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