Effects of Te precipitation on IR transmittance and crystalline quality of as-grown CdZnTe crystals

The relationship of the Te precipitated phase concentration in the matrix to IR transmittance and crystalline quality of as-grown CdZnTe wafers was investigated by means of various optical and structural techniques including infrared (IR) transmission, differential scanning calorimetry (DSC) and Rutherford backscattering spectroscopy (RBS). Results indicate that Te precipitates/inclusions in CdZnTe matrix reduce IR transmittance, especially at concentration ≥0.6 wt.%. Additionally, the crystalline perfection of near-stoichiometric as-grown CdZnTe is better than that of non-stoichiometric samples, and decreases with increasing second-phase concentration.