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Dielectric suppression of nanosolid silicon

  • L. K. Pan*
  • , Chang Q. Sun
  • , T. P. Chen
  • , S. Li
  • , C. M. Li
  • , B. K. Tay
  • *此作品的通讯作者
  • Nanyang Technological University

科研成果: 期刊稿件文章同行评审

摘要

An analytical solution is presented showing that the dielectric susceptibility of a nanosolid depends functionally on the crystal binding that determines the bandgap and hence the essential processes of electron polarization, and on the electron-phonon coupling, that is often overlooked in theory considerations. The derived solution covers all the measured values of bandgap expansion that are beyond the reach of available approaches. Consistency between predictions and impedance measurements evidences the impact of atomic coordination-number imperfection on the dielectric performance of nanometric semiconductors and the validity of the given solution.

源语言英语
页(从-至)1802-1806
页数5
期刊Nanotechnology
15
12
DOI
出版状态已出版 - 12月 2004
已对外发布

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