Dielectric relaxation in layer-structured SrBi_2-xNd _xNb₂O₉ ceramics (x = 0, 0.05, 0.2, 0.35)

SrBi_2-xNd_xNb₂O₉ (x = 0, 0.05, 0.2, 0.35) ceramics were synthesized by the traditional solid-state sintering method. X-ray diffraction analysis showed that single-phase-layered perovskites were obtained for all compositions. The substitution of Nd³⁺ for Bi³⁺ induced a relaxor behavior of frequency dispersion for Nd-doped SrBi₂Nb₂O₉.The parameter of frequency dispersion ΔT_m, which is the T_m between 1 kHz and 1 MHz, increases from 0°C for x = 0 to 13°C for x = 0.35, and the degree of relaxor behavior γ increases from 0.96 for x = 0 to 2.02 for x = 0.35. The temperature of the maximum dielectric constant T_m decreases linearly with an increase in the Nd content (x).