摘要
The determination of cut-off wavelength, λco, and composition distribution for Hg1-xCdxTe has been discussed in this paper. A shift of the cut-off wavelength was found from the photo-response calculation for the HgCdTe devices with the same energy gap Eg but different thickness d. An expression of λco(x,T,d) has been derived from the half-maximum photo-response curve calculation. The composition uniformity has been determined from the room-temperature transmission fitting procedure. The composition real space distribution is suggested to be determined by the combination of absorption edge phenomenon and thermal imaging technique.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 718-721 |
| 页数 | 4 |
| 期刊 | Journal of Electronic Materials |
| 卷 | 27 |
| 期 | 6 |
| DOI | |
| 出版状态 | 已出版 - 6月 1998 |
| 已对外发布 | 是 |
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