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Determination of cut-off wavelength and composition distribution in Hg1-xCdxTe

  • Junhao Chu*
  • , Yongsheng Gui
  • , Biao Li
  • , Dingyuan Tang
  • *此作品的通讯作者
  • CAS - Shanghai Institute of Technical Physics

科研成果: 期刊稿件文章同行评审

摘要

The determination of cut-off wavelength, λco, and composition distribution for Hg1-xCdxTe has been discussed in this paper. A shift of the cut-off wavelength was found from the photo-response calculation for the HgCdTe devices with the same energy gap Eg but different thickness d. An expression of λco(x,T,d) has been derived from the half-maximum photo-response curve calculation. The composition uniformity has been determined from the room-temperature transmission fitting procedure. The composition real space distribution is suggested to be determined by the combination of absorption edge phenomenon and thermal imaging technique.

源语言英语
页(从-至)718-721
页数4
期刊Journal of Electronic Materials
27
6
DOI
出版状态已出版 - 6月 1998
已对外发布

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