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Detection of resistive switching behavior based on the Al2O3/ZnO/Al2O3 structure with alumina buffers

  • East China Normal University
  • CAS - Shanghai Institute of Technical Physics

科研成果: 期刊稿件文章同行评审

摘要

The single ZnO layer and a sandwich Al2O3/ZnO/Al2O3 structure were prepared via atomic layer deposition, and the single ZnO layer showed a feature of ohmic conduction only. When we added that together with top and bottom alumina buffers, a non-polar resistive switching (RS) behavior was accomplished, allowing investigation of its electric endurance and retention characteristics. Analysis of the conduction mechanism at both high and low resistance states using auxiliary mathematic tools resulted in the proposed model of conducting filaments formed in the insulating Al2O3 buffers. The effect of stopping voltage Vend on the resistance window at high resistance state is studied and discussed.

源语言英语
页(从-至)8-13
页数6
期刊Thin Solid Films
623
DOI
出版状态已出版 - 1 2月 2017

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