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Coulomb interaction-induced jitter amplification in RF-compressed high-brightness electron source ultrafast electron diffraction

  • Yingpeng Qi
  • , Minjie Pei
  • , Dalong Qi
  • , Jing Li
  • , Yan Yang*
  • , Tianqing Jia
  • , Shian Zhang
  • , Zhenrong Sun
  • *此作品的通讯作者
  • East China Normal University
  • Shanxi University
  • CAS - Shanghai Institute of Optics and Fine Mechanics

科研成果: 期刊稿件 › 文章 › 同行评审

摘要

We have theoretically and experimentally demonstrated an RF compression-based jitter-amplification effect in high-brightness electron source ultrafast electron diffraction (UED), which degrades the temporal resolution significantly. A detailed analysis and simulations reveal the crucial role of the longitudinal and transverse Coulomb interaction for this jitter-amplification effect, which accord very well with experimental results. An optimized compact UED structure for full compression has been proposed, which can suppress the jitter by half and improve the temporal resolution to sub-100 fs. This Coulomb interaction-induced jitter amplification exists in nearly the whole ultrafast physics field where laser-electron synchronization is required. Moreover, it cannot be suppressed completely. The quantified explanation for the mechanism and optimization provides important guidance for photocathode accelerators and other compression-based ultrashort electron pulse generation and precise control.

源语言英语
期刊论文编号023015
期刊New Journal of Physics
卷19
期2
DOI
出版状态已出版 - 2月 2017

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