Corrigendum to “WDP-BNN: Efficient wafer defect pattern classification via binarized neural network” [Integration 85 (2022) 76–86, (Integration (2022) 85(76-86) (S0167926022000414), (10.1016/j.vlsi.2022.04.003))

Qing Zhang; Yuhang Zhang; Jizuo Li; Yongfu Li

doi:10.1016/j.vlsi.2022.09.001

Corrigendum to “WDP-BNN: Efficient wafer defect pattern classification via binarized neural network” [Integration 85 (2022) 76–86, (Integration (2022) 85(76-86) (S0167926022000414), (10.1016/j.vlsi.2022.04.003))

Qing Zhang
, Yuhang Zhang
, Jizuo Li
, Yongfu Li^*

^*此作品的通讯作者

Shanghai Jiao Tong University

科研成果: 期刊稿件 › 评论/辩论

摘要

The authors regret the incorrect publication of Fig. 5 and an incorrect citation in the original article of the published version. Fig. 3 should have been cited in the first sentence of Section 3.3. Instead, it is cited as Fig. 2 under this section. The correct version of Fig. 5 is presented below.[Formula presented] The authors would like to apologise for any inconvenience caused.

源语言	英语
页（从-至）	10
页数	1
期刊	Integration
卷	88
DOI	https://doi.org/10.1016/j.vlsi.2022.09.001
出版状态	已出版 - 1月 2023
已对外发布	是

访问文件

10.1016/j.vlsi.2022.09.001

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引用此

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title = "Corrigendum to {\textquotedblleft}WDP-BNN: Efficient wafer defect pattern classification via binarized neural network{\textquotedblright} [Integration 85 (2022) 76{\textendash}86, (Integration (2022) 85(76-86) (S0167926022000414), (10.1016/j.vlsi.2022.04.003))",

abstract = "The authors regret the incorrect publication of Fig. 5 and an incorrect citation in the original article of the published version. Fig. 3 should have been cited in the first sentence of Section 3.3. Instead, it is cited as Fig. 2 under this section. The correct version of Fig. 5 is presented below.[Formula presented] The authors would like to apologise for any inconvenience caused.",

author = "Qing Zhang and Yuhang Zhang and Jizuo Li and Yongfu Li",

note = "Publisher Copyright: {\textcopyright} 2022",

year = "2023",

month = jan,

doi = "10.1016/j.vlsi.2022.09.001",

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T2 - Efficient wafer defect pattern classification via binarized neural network” [Integration 85 (2022) 76–86, (Integration (2022) 85(76-86) (S0167926022000414), (10.1016/j.vlsi.2022.04.003))

AU - Zhang, Qing

AU - Zhang, Yuhang

AU - Li, Jizuo

AU - Li, Yongfu

PY - 2023/1

Y1 - 2023/1

N2 - The authors regret the incorrect publication of Fig. 5 and an incorrect citation in the original article of the published version. Fig. 3 should have been cited in the first sentence of Section 3.3. Instead, it is cited as Fig. 2 under this section. The correct version of Fig. 5 is presented below.[Formula presented] The authors would like to apologise for any inconvenience caused.

AB - The authors regret the incorrect publication of Fig. 5 and an incorrect citation in the original article of the published version. Fig. 3 should have been cited in the first sentence of Section 3.3. Instead, it is cited as Fig. 2 under this section. The correct version of Fig. 5 is presented below.[Formula presented] The authors would like to apologise for any inconvenience caused.

UR - https://www.scopus.com/pages/publications/85137307593

U2 - 10.1016/j.vlsi.2022.09.001

DO - 10.1016/j.vlsi.2022.09.001

M3 - 评论/辩论

AN - SCOPUS:85137307593

SN - 0167-9260

VL - 88

SP - 10

JO - Integration

JF - Integration

ER -