Characterization of Mn_1.56 Co_0.96 Ni _0.48O₄ films for infrared detection

Mn1.56Co0.96Ni0.48O4 films with spinel structure were prepared on Al2 O3 substrate by chemical solution deposition method. The microstructure of the films was studied by atomic force microscope and field-emission scanning electron microscope. The current-voltage characteristics showed Ohmic conductivity in the temperature range of 245-295 K. The conduction was described by a variable range hopping model for a parabolic density of states. The advantages of high characteristic temperature, as well as high transition temperature (201 K) between ferromagnetic and paramagnetic phases make the Mn_1.56 Co_0.96 Ni_0.48O₄ films very promising for infrared detection, especially for functional devices by integrating magnetic and electronic properties of the materials.