TY - GEN
T1 - CE-Based Optimization for Real-time System Availability under Learned Soft Error Rate
AU - Li, Liying
AU - Wei, Tongquan
AU - Zhou, Junlong
AU - Chen, Mingsong
AU - Hu, Xiaobo Sharon
N1 - Publisher Copyright:
© 2019 EDAA.
PY - 2019/5/14
Y1 - 2019/5/14
N2 - As the density of integrated circuits continues to increase, the possibility that real-time systems suffer from transient and permanent failures rises significantly, resulting in a degraded availability of system functionality. In this paper, we investigate the dynamic modeling of transient failure rate based on Back Propagation (BP) neural network, and propose an optimization strategy for system availability based on Cross Entropy (CE). Specifically, the neural network is trained using cross-layer simulation data obtained from SPICE simulation while the CE-based optimization for system functionality availability is achieved by judiciously selecting an optimal supply voltage for processors under timing constraints. Simulation results show that the proposed method can achieve system availability improvement of up to 32% compared to benchmarking methods.
AB - As the density of integrated circuits continues to increase, the possibility that real-time systems suffer from transient and permanent failures rises significantly, resulting in a degraded availability of system functionality. In this paper, we investigate the dynamic modeling of transient failure rate based on Back Propagation (BP) neural network, and propose an optimization strategy for system availability based on Cross Entropy (CE). Specifically, the neural network is trained using cross-layer simulation data obtained from SPICE simulation while the CE-based optimization for system functionality availability is achieved by judiciously selecting an optimal supply voltage for processors under timing constraints. Simulation results show that the proposed method can achieve system availability improvement of up to 32% compared to benchmarking methods.
UR - https://www.scopus.com/pages/publications/85066631827
U2 - 10.23919/DATE.2019.8715207
DO - 10.23919/DATE.2019.8715207
M3 - 会议稿件
AN - SCOPUS:85066631827
T3 - Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
SP - 1331
EP - 1336
BT - Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 22nd Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
Y2 - 25 March 2019 through 29 March 2019
ER -