Calibration standards and measurement accuracy of absolute electroluminescence and internal properties in multi-junction and arrayed solar cells

Masahiro Yoshita; Lin Zhu; Changsu Kim; Toshimitsu Mochizuki; Tetsuya Nakamura; Mitsuru Imaizumi; Shaoqiang Chen; Hidehiro Kubota; Yoshihiko Kanemitsu; Hidefumi Akiyama

doi:10.1117/12.2211726

Calibration standards and measurement accuracy of absolute electroluminescence and internal properties in multi-junction and arrayed solar cells

Masahiro Yoshita
, Lin Zhu
, Changsu Kim
, Toshimitsu Mochizuki
, Tetsuya Nakamura
, Mitsuru Imaizumi
, Shaoqiang Chen
, Hidehiro Kubota
, Yoshihiko Kanemitsu
, Hidefumi Akiyama

通信与电子工程学院

Japan Science and Technology Agency
National Institute of Advanced Industrial Science and Technology
Japan Aerospace Exploration Agency

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

6 引用（Scopus）

摘要

We developed methodologies and calibration standards for absolute electroluminescence (EL) measurements for CONTACT-LESS evaluation of various internal properties of multi-junction and arrayed solar cells, such as open-circuit voltages, external and internal radiative efficiencies, and luminescence-coupling efficiency. Several independent calibration methods were compared that used: 1) a calibrated EL imaging system, 2) proximity measurement with a large-area photodiode, 3) an integrating-sphere system, and 4) planar light-emitting diodes with a circular aperture. The comparison clarified the advantages and disadvantages of each method, and showed consistency within 30% uncertainty, resulting in a 7-meV uncertainty in open-circuit voltage measurements.

源语言	英语
主期刊名	Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V
编辑	Masakazu Sugiyama, Alexandre Freundlich, Laurent Lombez
出版商	SPIE
ISBN（电子版）	9781628419788
DOI	https://doi.org/10.1117/12.2211726
出版状态	已出版 - 2016
活动	Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V - San Francisco, 美国期限: 15 2月 2016 → 17 2月 2016

出版系列

姓名	Proceedings of SPIE - The International Society for Optical Engineering
卷	9743
ISSN（印刷版）	0277-786X
ISSN（电子版）	1996-756X

会议

会议	Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V
国家/地区	美国
市	San Francisco
时期	15/02/16 → 17/02/16

访问文件

10.1117/12.2211726

其它文件与链接

链接到 Scopus 的出版物

引用此

Yoshita, M., Zhu, L., Kim, C., Mochizuki, T., Nakamura, T., Imaizumi, M., Chen, S., Kubota, H., Kanemitsu, Y., & Akiyama, H. (2016). Calibration standards and measurement accuracy of absolute electroluminescence and internal properties in multi-junction and arrayed solar cells. 在 M. Sugiyama, A. Freundlich, & L. Lombez (编辑), Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V 文章 97430D (Proceedings of SPIE - The International Society for Optical Engineering; 卷 9743). SPIE. https://doi.org/10.1117/12.2211726

Yoshita, Masahiro ; Zhu, Lin ; Kim, Changsu 等. / Calibration standards and measurement accuracy of absolute electroluminescence and internal properties in multi-junction and arrayed solar cells. Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V. 编辑 / Masakazu Sugiyama ; Alexandre Freundlich ; Laurent Lombez. SPIE, 2016. (Proceedings of SPIE - The International Society for Optical Engineering).

@inproceedings{6b3fe0b507044af5b1a9de8505d215b5,

title = "Calibration standards and measurement accuracy of absolute electroluminescence and internal properties in multi-junction and arrayed solar cells",

abstract = "We developed methodologies and calibration standards for absolute electroluminescence (EL) measurements for CONTACT-LESS evaluation of various internal properties of multi-junction and arrayed solar cells, such as open-circuit voltages, external and internal radiative efficiencies, and luminescence-coupling efficiency. Several independent calibration methods were compared that used: 1) a calibrated EL imaging system, 2) proximity measurement with a large-area photodiode, 3) an integrating-sphere system, and 4) planar light-emitting diodes with a circular aperture. The comparison clarified the advantages and disadvantages of each method, and showed consistency within 30\% uncertainty, resulting in a 7-meV uncertainty in open-circuit voltage measurements.",

keywords = "Calibration standard, Electroluminescence, Imaging, Internal properties, Multi-junction solar cells, Open-circuit voltage, Photovoltaics",

author = "Masahiro Yoshita and Lin Zhu and Changsu Kim and Toshimitsu Mochizuki and Tetsuya Nakamura and Mitsuru Imaizumi and Shaoqiang Chen and Hidehiro Kubota and Yoshihiko Kanemitsu and Hidefumi Akiyama",

note = "Publisher Copyright: {\textcopyright} 2016 SPIE.; Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V ; Conference date: 15-02-2016 Through 17-02-2016",

year = "2016",

doi = "10.1117/12.2211726",

language = "英语",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "SPIE",

editor = "Masakazu Sugiyama and Alexandre Freundlich and Laurent Lombez",

booktitle = "Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V",

address = "美国",

}

Yoshita, M, Zhu, L, Kim, C, Mochizuki, T, Nakamura, T, Imaizumi, M, Chen, S, Kubota, H, Kanemitsu, Y & Akiyama, H 2016, Calibration standards and measurement accuracy of absolute electroluminescence and internal properties in multi-junction and arrayed solar cells. 在 M Sugiyama, A Freundlich & L Lombez (编辑), Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V., 97430D, Proceedings of SPIE - The International Society for Optical Engineering, 卷 9743, SPIE, Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V, San Francisco, 美国, 15/02/16. https://doi.org/10.1117/12.2211726

Calibration standards and measurement accuracy of absolute electroluminescence and internal properties in multi-junction and arrayed solar cells. / Yoshita, Masahiro; Zhu, Lin; Kim, Changsu 等.
Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V. 编辑 / Masakazu Sugiyama; Alexandre Freundlich; Laurent Lombez. SPIE, 2016. 97430D (Proceedings of SPIE - The International Society for Optical Engineering; 卷 9743).

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

TY - GEN

T1 - Calibration standards and measurement accuracy of absolute electroluminescence and internal properties in multi-junction and arrayed solar cells

AU - Yoshita, Masahiro

AU - Zhu, Lin

AU - Kim, Changsu

AU - Mochizuki, Toshimitsu

AU - Nakamura, Tetsuya

AU - Imaizumi, Mitsuru

AU - Chen, Shaoqiang

AU - Kubota, Hidehiro

AU - Kanemitsu, Yoshihiko

AU - Akiyama, Hidefumi

PY - 2016

Y1 - 2016

N2 - We developed methodologies and calibration standards for absolute electroluminescence (EL) measurements for CONTACT-LESS evaluation of various internal properties of multi-junction and arrayed solar cells, such as open-circuit voltages, external and internal radiative efficiencies, and luminescence-coupling efficiency. Several independent calibration methods were compared that used: 1) a calibrated EL imaging system, 2) proximity measurement with a large-area photodiode, 3) an integrating-sphere system, and 4) planar light-emitting diodes with a circular aperture. The comparison clarified the advantages and disadvantages of each method, and showed consistency within 30% uncertainty, resulting in a 7-meV uncertainty in open-circuit voltage measurements.

AB - We developed methodologies and calibration standards for absolute electroluminescence (EL) measurements for CONTACT-LESS evaluation of various internal properties of multi-junction and arrayed solar cells, such as open-circuit voltages, external and internal radiative efficiencies, and luminescence-coupling efficiency. Several independent calibration methods were compared that used: 1) a calibrated EL imaging system, 2) proximity measurement with a large-area photodiode, 3) an integrating-sphere system, and 4) planar light-emitting diodes with a circular aperture. The comparison clarified the advantages and disadvantages of each method, and showed consistency within 30% uncertainty, resulting in a 7-meV uncertainty in open-circuit voltage measurements.

KW - Calibration standard

KW - Electroluminescence

KW - Imaging

KW - Internal properties

KW - Multi-junction solar cells

KW - Open-circuit voltage

KW - Photovoltaics

UR - https://www.scopus.com/pages/publications/84982144495

U2 - 10.1117/12.2211726

DO - 10.1117/12.2211726

M3 - 会议稿件

AN - SCOPUS:84982144495

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V

A2 - Sugiyama, Masakazu

A2 - Freundlich, Alexandre

A2 - Lombez, Laurent

PB - SPIE

T2 - Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V

Y2 - 15 February 2016 through 17 February 2016

ER -

Yoshita M, Zhu L, Kim C, Mochizuki T, Nakamura T, Imaizumi M 等. Calibration standards and measurement accuracy of absolute electroluminescence and internal properties in multi-junction and arrayed solar cells. 在 Sugiyama M, Freundlich A, Lombez L, 编辑, Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V. SPIE. 2016. 97430D. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.2211726

Calibration standards and measurement accuracy of absolute electroluminescence and internal properties in multi-junction and arrayed solar cells

摘要

出版系列

会议

访问文件

其它文件与链接

指纹

引用此