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Atomistic Insight into the Epitaxial Growth Mechanism of Single-Crystal Two-Dimensional Transition-Metal Dichalcogenides on Au(111) Substrate

  • Degong Ding
  • , Shuang Wang
  • , Yipu Xia
  • , Pai Li*
  • , Daliang He
  • , Junqiu Zhang
  • , Sunwen Zhao
  • , Guanghui Yu*
  • , Yonghui Zheng
  • , Yan Cheng
  • , Maohai Xie*
  • , Feng Ding
  • , Chuanhong Jin*
  • *此作品的通讯作者
  • Zhejiang University
  • CAS - Shanghai Institute of Microsystem and Information Technology
  • The University of Hong Kong
  • Ulsan National Institute of Science and Technology
  • East China Normal University
  • Jihua Laboratory

科研成果: 期刊稿件文章同行评审

摘要

A mechanistic understanding of interactions between atomically thin two-dimensional (2D) transition-metal dichalcogenides (TMDs) and their growth substrates is important for achieving the unidirectional alignment of nuclei and seamless stitching of 2D TMD domains and thus 2D wafers. In this work, we conduct a cross-sectional scanning transmission electron microscopy (STEM) study to investigate the atomic-scale nucleation and early stage growth behaviors of chemical vapor deposited monolayer (ML-) MoS2and molecular beam epitaxy ML-MoSe2on a Au(111) substrate. Statistical analysis reveals the majority of as-grown domains, i.e., ∼88% for MoS2and 90% for MoSe2, nucleate on surface terraces, with the rest (i.e., ∼12% for MoS2and 10% for MoSe2) on surface steps. Moreover, within the latter case, step-associated nucleation, ∼64% of them are terminated with a Mo-zigzag edge in connection with the Au surface steps, with the rest (∼36%) being S-zigzag edges. In conjunction with ab initio density functional theory calculations, the results confirm that van der Waals epitaxy, rather than the surface step guided epitaxy, plays deterministic roles for the realization of unidirectional ML-MoS2(MoSe2) domains on a Au(111) substrate. In contrast, surface steps, particularly their step height, are mainly responsible for the integrity and thickness of MoS2/MoSe2films. In detail, it is found that the lateral growth of monolayer thick MoS2/MoSe2domains only proceeds across mono-Au-atom high surface steps (∼2.4 Å), but fail for higher ones (bi-Au atom step and higher) during the growth. Our cross-sectional STEM study also confirms the existence of considerable compressive residual strain that reaches ∼3.0% for ML-MoS2/MoSe2domains on Au(111). The present study aims to understand the growth mechanism of 2D TMD wafers.

源语言英语
页(从-至)17356-17364
页数9
期刊ACS Nano
16
10
DOI
出版状态已出版 - 25 10月 2022

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