摘要
Complex oxide heterointerfaces, which play host to an incredible variety of interface physical phenomena, are of great current interest in introducing new functionalities to systems. Here, coherent super-tetragonal BiFeO 3/LaAlO3 and rhombohedral BiFeO3/LaAlO 3 heterointerfaces are investigated by using a combination of high-angle annular dark-field (HAADF) imaging and annular bright-field (ABF) imaging in a spherical aberration (Cs) corrected scanning transmission electron microscope (STEM), and first-principles calculations. The complicated ferroelectric polarization pinning and relaxation that occurs at both interfaces is revealed with atomic resolution, with a dramatic change in structure of BiFeO3, from cubic to super-tetragonal-like. The results enable a detailed explanation to be given of how non-bulk phase structures are stabilized in thin films of this material. Changes in lattice strain and symmetry in BiFeO3 (BFO) crystals at coherent T-BFO/LaAlO3 (LAO) and rhombohedral-BFO/LAO interfaces are imaged with atomic resolution using annular bright-field scanning transmission electron microscopy and first-principles calculations. A common pinned BFO layer and polarization relaxation at the interfaces are identified, providing insight into the ferroelectric behavior of thin films and the complex oxide heterointerfaces between them.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 793-799 |
| 页数 | 7 |
| 期刊 | Advanced Functional Materials |
| 卷 | 24 |
| 期 | 6 |
| DOI | |
| 出版状态 | 已出版 - 12 2月 2014 |
指纹
探究 'Atomic-scale visualization of polarization pinning and relaxation at coherent BiFeO3/LaAlO3 interfaces' 的科研主题。它们共同构成独一无二的指纹。引用此
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