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Arsenic-doped narrow-gap HgCdTe epilayers studied by infrared modulation spectroscopy

  • Jun Shao*
  • , Wei Lu
  • , Lu Chen
  • , Xiang Lu
  • , Shaoling Guo
  • , Junhao Chu
  • , Li He
  • *此作品的通讯作者
  • CAS - Shanghai Institute of Technical Physics

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

We outline experimental data recently established in our study of in-situ arsenic (As) doped narrow-gap Hg1-xCdxTe films by infrared modulation spectroscopy. After a brief introduction of the step-scan Fourier transform infrared spectrometer-based modulation spectroscopic techniques, impurity levels and photomodulation mechanisms in As-doped HgCdTe epilayers are surveyed based on infrared modulation spectroscopic data, and the possibility of identifying cutoff wavelength and vertical uniformity of HgCdTe epilayers is indicated. The results illustrate that the infrared modulation spectroscopy will play an important role in optical characterization of narrow-gap semiconductors.

源语言英语
主期刊名Seventh International Conference on Thin Film Physics and Applications
DOI
出版状态已出版 - 2011
已对外发布
活动7th International Conference on Thin Film Physics and Applications - Shanghai, 中国
期限: 24 9月 201027 9月 2010

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
7995
ISSN(印刷版)0277-786X

会议

会议7th International Conference on Thin Film Physics and Applications
国家/地区中国
Shanghai
时期24/09/1027/09/10

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