@inproceedings{c26242e57f884632be970a470bcd0102,
title = "An Automatic Comparator Offset Calibration for High-Speed Flash ADCs in FDSOI CMOS Technology",
abstract = "This paper presents an automatic comparator offset calibration scheme for designing high-speed flash analog-to-digital data converters (ADCs). It leverages the threshold voltage control capability via back-gate in FDSOI CMOS technology and thus does not require extra transistor pairs or capacitive loads, avoiding comparator speed degradation. An automatic calibration approach employing a successive approximation algorithm (SAA) is also developed. The comparator along with the calibration circuit are designed in a 28-nm FDSOI CMOS process. Simulation results show that the design achieves a resolution of 1.84 mV and a calibration range of ±58 mV with a power consumption of 440 μW under a 1V power supply.",
keywords = "FDSOI, High-speed comparator, flash ADC, offset calibration",
author = "Yulang Feng and Qingjun Fan and Hao Deng and Jeffrey Chen and Runxi Zhang and Phaneendra Bikkina and Jinghong Chen",
note = "Publisher Copyright: {\textcopyright} 2020 IEEE.; 11th IEEE Latin American Symposium on Circuits and Systems, LASCAS 2020 ; Conference date: 25-02-2020 Through 28-02-2020",
year = "2020",
month = feb,
doi = "10.1109/LASCAS45839.2020.9069018",
language = "英语",
series = "2020 IEEE 11th Latin American Symposium on Circuits and Systems, LASCAS 2020",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2020 IEEE 11th Latin American Symposium on Circuits and Systems, LASCAS 2020",
address = "美国",
}