摘要
Ti-doped Ge2Sb2Te5 (GSTT) materials have been investigated for phase change memory (PCM) applications. Compared with GST, GSTT5.67% phase change material has a higher crystallization temperature (∼230°C), a higher crystallization activation energy (2.79 eV) and a better data retention ability (∼134°C for 10-year). The PCM cell based on GSTT5.67% exhibits lower power consumption than GST based one. Endurance up to 1 × 104 cycles with high/low resistance ratio of over one order of magnitude has been achieved.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | P102-P104 |
| 期刊 | ECS Solid State Letters |
| 卷 | 4 |
| 期 | 12 |
| DOI | |
| 出版状态 | 已出版 - 2015 |
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