A study on the thermostability of LaNiO3 films

Qiang Zhao; Z. M. Huang; Z. G. Hu; J. H. Chu

doi:10.1016/j.surfcoat.2004.05.004

A study on the thermostability of LaNiO₃ films

Qiang Zhao^*
, Z. M. Huang
, Z. G. Hu
, J. H. Chu

^*此作品的通讯作者

East China Normal University
CAS - Shanghai Institute of Technical Physics

科研成果: 期刊稿件 › 文章 › 同行评审

12 引用（Scopus）

摘要

Thin LaNiO_3-x films with pseudocubic (100) preferred orientation were prepared by rf magnetron sputtering and in situ annealed at 265 °C. X-ray diffraction (XRD) results indicate that the annealing did not cause the lattice distortion of the films. The electric conductivity, the refractive index and the extinction coefficient decrease exponentially as annealing time increases. X-ray photoelectron spectroscopy (XPS) analysis manifested that the oxygen concentration in the LaNiO_3-x film decreased 2.7% after 2 h annealing and the loss of the lattice oxygen in films led to the changes of the properties of the LaNiO_3-x films.

源语言	英语
页（从-至）	336-340
页数	5
期刊	Surface and Coatings Technology
卷	192
期	2-3
DOI	https://doi.org/10.1016/j.surfcoat.2004.05.004
出版状态	已出版 - 21 3月 2005
已对外发布	是

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@article{0d7f861f8c5a4056a1e7c53624c3bf5d,

title = "A study on the thermostability of LaNiO3 films",

abstract = "Thin LaNiO3-x films with pseudocubic (100) preferred orientation were prepared by rf magnetron sputtering and in situ annealed at 265 °C. X-ray diffraction (XRD) results indicate that the annealing did not cause the lattice distortion of the films. The electric conductivity, the refractive index and the extinction coefficient decrease exponentially as annealing time increases. X-ray photoelectron spectroscopy (XPS) analysis manifested that the oxygen concentration in the LaNiO3-x film decreased 2.7\% after 2 h annealing and the loss of the lattice oxygen in films led to the changes of the properties of the LaNiO3-x films.",

keywords = "Annealing, Conductivity, LaNiO, Optical properties",

author = "Qiang Zhao and Huang, \{Z. M.\} and Hu, \{Z. G.\} and Chu, \{J. H.\}",

year = "2005",

month = mar,

day = "21",

doi = "10.1016/j.surfcoat.2004.05.004",

language = "英语",

volume = "192",

pages = "336--340",

journal = "Surface and Coatings Technology",

issn = "0257-8972",

publisher = "Elsevier B.V.",

number = "2-3",

}

TY - JOUR

T1 - A study on the thermostability of LaNiO3 films

AU - Zhao, Qiang

AU - Huang, Z. M.

AU - Hu, Z. G.

AU - Chu, J. H.

PY - 2005/3/21

Y1 - 2005/3/21

N2 - Thin LaNiO3-x films with pseudocubic (100) preferred orientation were prepared by rf magnetron sputtering and in situ annealed at 265 °C. X-ray diffraction (XRD) results indicate that the annealing did not cause the lattice distortion of the films. The electric conductivity, the refractive index and the extinction coefficient decrease exponentially as annealing time increases. X-ray photoelectron spectroscopy (XPS) analysis manifested that the oxygen concentration in the LaNiO3-x film decreased 2.7% after 2 h annealing and the loss of the lattice oxygen in films led to the changes of the properties of the LaNiO3-x films.

AB - Thin LaNiO3-x films with pseudocubic (100) preferred orientation were prepared by rf magnetron sputtering and in situ annealed at 265 °C. X-ray diffraction (XRD) results indicate that the annealing did not cause the lattice distortion of the films. The electric conductivity, the refractive index and the extinction coefficient decrease exponentially as annealing time increases. X-ray photoelectron spectroscopy (XPS) analysis manifested that the oxygen concentration in the LaNiO3-x film decreased 2.7% after 2 h annealing and the loss of the lattice oxygen in films led to the changes of the properties of the LaNiO3-x films.

KW - Annealing

KW - Conductivity

KW - LaNiO

KW - Optical properties

UR - https://www.scopus.com/pages/publications/11244305727

U2 - 10.1016/j.surfcoat.2004.05.004

DO - 10.1016/j.surfcoat.2004.05.004

M3 - 文章

AN - SCOPUS:11244305727

SN - 0257-8972

VL - 192

SP - 336

EP - 340

JO - Surface and Coatings Technology

JF - Surface and Coatings Technology

IS - 2-3

ER -

A study on the thermostability of LaNiO3 films

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A study on the thermostability of LaNiO₃ films