A special configuration of lead zirconate titanate multilayer stack with superior electrical and optical properties

A unique configuration of PbZr_0.4Ti_0.6O₃ multilayer stack was designed and grown on F-doped tin oxide thin film by spin casting and annealing process. The multilayer system exhibits a broad reflection band with peak reflectivity over 95% and band width no < 40 nm, a dielectric constant of 520 and dielectric tunability of ∼49% at 1 MHz, a remanent polarization of 46.8 μC/cm², and a polarization loss of < 5% after 10⁹ polarization switching cycles, rendering excellent performance as 1D photonic crystals and as ferroelectric and dielectric media. This material structure may find application in photonic band-gap engineering, microwave tunable devices, and integrated optoelectronics.