A simple method of deducing the optical constants of thin films using the optical transmission spectrum

Qiang Zhao; Ji Qing Wang; Zhi Fang Chai

A simple method of deducing the optical constants of thin films using the optical transmission spectrum

Qiang Zhao^*
, Ji Qing Wang
, Zhi Fang Chai

^*此作品的通讯作者

物理与电子科学学院

East China Normal University

科研成果: 期刊稿件 › 文章 › 同行评审

1 引用（Scopus）

摘要

According to the single oscillator expression, based on a based on classic electromagnetic dispersion model, a simple and efficient computer program aided method for deducing the optical refractive index and thickness of a thin film from the normal-incident transmission spectrum was proposed. A dc sputtered ZnO film was analyzed using the method, The results demonstrated that the method is practicable.

源语言	英语
页（从-至）	2046-2049
页数	4
期刊	Guangzi Xuebao/Acta Photonica Sinica
卷	38
期	8
出版状态	已出版 - 8月 2009

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title = "A simple method of deducing the optical constants of thin films using the optical transmission spectrum",

abstract = "According to the single oscillator expression, based on a based on classic electromagnetic dispersion model, a simple and efficient computer program aided method for deducing the optical refractive index and thickness of a thin film from the normal-incident transmission spectrum was proposed. A dc sputtered ZnO film was analyzed using the method, The results demonstrated that the method is practicable.",

keywords = "Optical spectrum analysis, Single oscillator expression, Thin film",

author = "Qiang Zhao and Wang, \{Ji Qing\} and Chai, \{Zhi Fang\}",

year = "2009",

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language = "英语",

volume = "38",

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T1 - A simple method of deducing the optical constants of thin films using the optical transmission spectrum

AU - Zhao, Qiang

AU - Wang, Ji Qing

AU - Chai, Zhi Fang

PY - 2009/8

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N2 - According to the single oscillator expression, based on a based on classic electromagnetic dispersion model, a simple and efficient computer program aided method for deducing the optical refractive index and thickness of a thin film from the normal-incident transmission spectrum was proposed. A dc sputtered ZnO film was analyzed using the method, The results demonstrated that the method is practicable.

AB - According to the single oscillator expression, based on a based on classic electromagnetic dispersion model, a simple and efficient computer program aided method for deducing the optical refractive index and thickness of a thin film from the normal-incident transmission spectrum was proposed. A dc sputtered ZnO film was analyzed using the method, The results demonstrated that the method is practicable.

KW - Optical spectrum analysis

KW - Single oscillator expression

KW - Thin film

UR - https://www.scopus.com/pages/publications/70350215735

M3 - 文章

AN - SCOPUS:70350215735

SN - 1004-4213

VL - 38

SP - 2046

EP - 2049

JO - Guangzi Xuebao/Acta Photonica Sinica

JF - Guangzi Xuebao/Acta Photonica Sinica

IS - 8

ER -

A simple method of deducing the optical constants of thin films using the optical transmission spectrum

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