A probabilistic model for the nonlinear electromagnetic inverse scattering: TM case

Electromagnetic inverse scattering (EMIS) is a noninvasive examination tool, which holds the promising potential in science, engineering, and military applications. In contrast to conventional tomography techniques, the inverse scattering is a quantitative superresolution imaging method since it is capable of accommodating more realistic interactions between the wavefield and the probed scene. In this paper, a full probabilistic formulation of the EMIS is presented for the first time, which is then solved by applying the well-known expectation maximization method. Afterward, the concept of the complex-valued alternating direction method of multipliers has been proposed as an alternative approach to solve the resulting nonlinear optimization problem. Finally, exemplary numerical and experimental results are provided to validate the proposed method.