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A High Accuracy and High Sensitivity System Architecture for Electrical Impedance Tomography System

  • Hui Li
  • , Boxiao Liu
  • , Yongfu Li
  • , Guoxing Wang
  • , Yong Lian
  • Shanghai Jiao Tong University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

A high accuracy and high sensitivity system architecture is proposed for the read-out circuit of electrical impedance tomography system-on-chip. The switched ratio-metric technique is applied in the proposed architecture. The proposed system architecture minimizes the device noise by processing signals from both read-out electrodes and the stimulus. The quantized signals are post-processed in the digital processing unit for proper signal demodulation and impedance ratio calculation. Our proposed architecture improves the sensitivity of the read-out circuit, cancels out the gain fluctuations in the system, and overcomes the effects of motion artifacts on measurements.

源语言英语
主期刊名2018 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018
出版商Institute of Electrical and Electronics Engineers Inc.
155-158
页数4
ISBN(电子版)9781538682401
DOI
出版状态已出版 - 2 7月 2018
已对外发布
活动14th IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018 - Chengdu, 中国
期限: 26 10月 201830 10月 2018

出版系列

姓名2018 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018

会议

会议14th IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018
国家/地区中国
Chengdu
时期26/10/1830/10/18

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