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A 6-b 20-Gs/s 2-way time-interleaved flash ADC with automatic comparator offset calibration in 28-nm FDSOI

  • Yulang Feng
  • , Hao Deng
  • , Qingjun Fan
  • , Runxi Zhang
  • , Phaneendra Bikkina
  • , Jinghong Chen

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

This paper presents a 6-bit 20 GS/s 2-way time-interleaved (TI) flash analog-to-digital converter (ADC) in a 28-nm FDSOI CMOS technology. Leveraging threshold voltage control via back-gate bias in FDSOI, an automatic comparator offset calibration scheme is developed, which does not require extra transistor pairs or capacitive loads in signal path, thus avoiding comparator speed degradation. To alleviate channel mismatch-induced errors in highly interleaved structure while maintaining a reasonable power efficiency, the ADC adopts a two-way TI structure with the subADC working at 10 GS/s. To further improve the ADC power efficiency, a 1-bit voltage-domain interpolation is utilized. The proposed flash ADC achieves a SNDR of 31.2 dB at Nyquist frequency with a power consumption of 204 mW, translating into a figure-of-merit (FOM) of 344 fJ/conv.-step.

源语言英语
主期刊名2020 IEEE International Symposium on Circuits and Systems, ISCAS 2020 - Proceedings
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9781728133201
出版状态已出版 - 2020
活动52nd IEEE International Symposium on Circuits and Systems, ISCAS 2020 - Virtual, Online
期限: 10 10月 202021 10月 2020

出版系列

姓名Proceedings - IEEE International Symposium on Circuits and Systems
2020-October
ISSN(印刷版)0271-4310

会议

会议52nd IEEE International Symposium on Circuits and Systems, ISCAS 2020
Virtual, Online
时期10/10/2021/10/20

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