摘要
The bandedge electronic structure including the optical bandgap, band-tail states, and deep/ shallow donor and acceptor levels in Cu2ZnSnS4 semiconductor was analyzed by absorption, photocurrent and photoluminescence spectroscopy, and the theoretical reports. It is revealed that the SnZn-related defect in Cu2ZnSnS4 with abundant defect states is one of the key factors affecting the band-edge electronic structure. High concentration of the neutral defect cluster[2 CuZn + SnZn]can narrow the band gap substantially, while the partially-passivated(ionic)defect cluster[CuZn + SnZn]is the main deep donor defect. A large number of band-tail states are responsible for the obvious red-shift of the bandedge-related photoluminescence transition energy. These detrimental defects related to SnZncan be effectively suppressed by properly reducing the Sn content in the copper-poor and zinc-rich growth condition, which also avoids the narrowing of the optical bandgap of the Cu2ZnSnS4 absorption layer.
| 投稿的翻译标题 | Optical characterization of bandedge electronic structure and defect states in Cu2ZnSnS4 |
|---|---|
| 源语言 | 繁体中文 |
| 页(从-至) | 92-98 |
| 页数 | 7 |
| 期刊 | Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves |
| 卷 | 39 |
| 期 | 1 |
| DOI | |
| 出版状态 | 已出版 - 1 2月 2020 |
关键词
- Bandgap
- CuZnSnS
- Semiconductor defects
- Spectroscopy characterization
指纹
探究 '铜锌锡硫带边电子结构及缺陷态的光学表征' 的科研主题。它们共同构成独一无二的指纹。引用此
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