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铜锌锡硫带边电子结构及缺陷态的光学表征

  • East China Normal University
  • CAS - Shanghai Institute of Technical Physics

科研成果: 期刊稿件文章同行评审

摘要

The bandedge electronic structure including the optical bandgap, band-tail states, and deep/ shallow donor and acceptor levels in Cu2ZnSnS4 semiconductor was analyzed by absorption, photocurrent and photoluminescence spectroscopy, and the theoretical reports. It is revealed that the SnZn-related defect in Cu2ZnSnS4 with abundant defect states is one of the key factors affecting the band-edge electronic structure. High concentration of the neutral defect cluster[2 CuZn + SnZn]can narrow the band gap substantially, while the partially-passivated(ionic)defect cluster[CuZn + SnZn]is the main deep donor defect. A large number of band-tail states are responsible for the obvious red-shift of the bandedge-related photoluminescence transition energy. These detrimental defects related to SnZncan be effectively suppressed by properly reducing the Sn content in the copper-poor and zinc-rich growth condition, which also avoids the narrowing of the optical bandgap of the Cu2ZnSnS4 absorption layer.

投稿的翻译标题Optical characterization of bandedge electronic structure and defect states in Cu2ZnSnS4
源语言繁体中文
页(从-至)92-98
页数7
期刊Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves
39
1
DOI
出版状态已出版 - 1 2月 2020

关键词

  • Bandgap
  • CuZnSnS
  • Semiconductor defects
  • Spectroscopy characterization

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