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β phase instability in poly(vinylidene fluoride/trifluoroethylene) thin films near β relaxation temperature

  • B. B. Tian
  • , X. F. Bai
  • , Y. Liu
  • , P. Gemeiner
  • , X. L. Zhao
  • , B. L. Liu
  • , Y. H. Zou
  • , X. D. Wang
  • , H. Huang
  • , J. L. Wang
  • , Sh Sun
  • , J. L. Sun
  • , B. Dkhil
  • , X. J. Meng
  • , J. H. Chu
  • CAS - Shanghai Institute of Technical Physics
  • Université Paris-Saclay
  • University of Chinese Academy of Sciences

科研成果: 期刊稿件文章同行评审

摘要

The β phase stability in poly(vinylidene fluoride/trifluoroethylene) [P(VDF-TrFE)] thin films was studied below 300 K using X-ray diffraction and polarization-electric-field (P-E) hysteresis loops measurements. On as-grown samples, an irreversible partial order-disorder transformation at Tβ ∼ 250 K, namely, the β relaxation temperature, was evidenced by the appearance of an additional X-Ray diffraction peak above Tβ as well as changes on the P-E loops on heating after the first cooling. This order-disorder-like transformation which is attributed to an all-trans order to helical disorder transition is suggested to take place in defect-rich regions like crystal-amorphous interphases and/or crystalline areas with randomly distributed TrFE defect-like units.

源语言英语
文章编号092902
期刊Applied Physics Letters
106
9
DOI
出版状态已出版 - 2 3月 2015
已对外发布

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