摘要
The β phase stability in poly(vinylidene fluoride/trifluoroethylene) [P(VDF-TrFE)] thin films was studied below 300 K using X-ray diffraction and polarization-electric-field (P-E) hysteresis loops measurements. On as-grown samples, an irreversible partial order-disorder transformation at Tβ ∼ 250 K, namely, the β relaxation temperature, was evidenced by the appearance of an additional X-Ray diffraction peak above Tβ as well as changes on the P-E loops on heating after the first cooling. This order-disorder-like transformation which is attributed to an all-trans order to helical disorder transition is suggested to take place in defect-rich regions like crystal-amorphous interphases and/or crystalline areas with randomly distributed TrFE defect-like units.
| 源语言 | 英语 |
|---|---|
| 文章编号 | 092902 |
| 期刊 | Applied Physics Letters |
| 卷 | 106 |
| 期 | 9 |
| DOI | |
| 出版状态 | 已出版 - 2 3月 2015 |
| 已对外发布 | 是 |
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